Analysis of Metrological Provision Problems of a Test Stand for Testing Radio-Electronic Products for Resistance to Irradiation with High-Energy Heavy Ions

The problems of the metrological certification of beams of high-energy heavy charged particles (HCPs) and protons that will be used in the study—as well as testing for radiation resistance—of promising products of semiconductor micro- and nanoelectronics, solid-state microwave electronics, and micro...

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Published inPhysics of particles and nuclei letters Vol. 16; no. 6; pp. 734 - 743
Main Authors Butenko, A. V., Syresin, E. M., Tyutyunnikov, S. I., Batyaev, V. F., Kulevoy, T. V., Pavlov, K. V., Rogov, V. I., Titarenko, A. Yu, Titarenko, Yu. E., Berlyand, A. V., Berlyand, V. A., Sobolevskiy, N. M., Bobrovskiy, D. V., Chumakov, A. I., Saburov, V. O., Soloviev, A. N., Pesic, M. P.
Format Journal Article
LanguageEnglish
Published Moscow Pleiades Publishing 01.11.2019
Springer Nature B.V
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Summary:The problems of the metrological certification of beams of high-energy heavy charged particles (HCPs) and protons that will be used in the study—as well as testing for radiation resistance—of promising products of semiconductor micro- and nanoelectronics, solid-state microwave electronics, and micromechanical systems are considered. One of the main requirements for such beams is ensuring the desired range of linear energy transfer (LET). Two methods for changing the LET are considered, one of which is based on using the ions of various types ( 16 O, 22 Ne, 40 Ar, 56 Fe, 84 Kr, 136 Xe, 209 Bi), and the other is based on using ion of the same type ( 197 Au), but with different energies. The advantages of using both methods are considered and the problems arising when using the second method are analyzed.
ISSN:1547-4771
1531-8567
DOI:10.1134/S1547477119060098