Analysis of Metrological Provision Problems of a Test Stand for Testing Radio-Electronic Products for Resistance to Irradiation with High-Energy Heavy Ions
The problems of the metrological certification of beams of high-energy heavy charged particles (HCPs) and protons that will be used in the study—as well as testing for radiation resistance—of promising products of semiconductor micro- and nanoelectronics, solid-state microwave electronics, and micro...
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Published in | Physics of particles and nuclei letters Vol. 16; no. 6; pp. 734 - 743 |
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Main Authors | , , , , , , , , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Moscow
Pleiades Publishing
01.11.2019
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | The problems of the metrological certification of beams of high-energy heavy charged particles (HCPs) and protons that will be used in the study—as well as testing for radiation resistance—of promising products of semiconductor micro- and nanoelectronics, solid-state microwave electronics, and micromechanical systems are considered. One of the main requirements for such beams is ensuring the desired range of linear energy transfer (LET). Two methods for changing the LET are considered, one of which is based on using the ions of various types (
16
O,
22
Ne,
40
Ar,
56
Fe,
84
Kr,
136
Xe,
209
Bi), and the other is based on using ion of the same type (
197
Au), but with different energies. The advantages of using both methods are considered and the problems arising when using the second method are analyzed. |
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ISSN: | 1547-4771 1531-8567 |
DOI: | 10.1134/S1547477119060098 |