Measurement of the Thermal Conductivity of Carbon Nanowalls by the 3ω Method
Carbon nanowall films with different thicknesses have been obtained by chemical deposition from a gas phase in a dc discharge. The thermal conductivity of the resulting structures has been measured for the first time using the 3ω method in the temperature range of 280–310 K. It has been shown that t...
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Published in | JETP letters Vol. 117; no. 6; pp. 449 - 455 |
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Main Authors | , , , , , , , , , |
Format | Journal Article |
Language | English |
Published |
Moscow
Pleiades Publishing
01.03.2023
Springer Nature B.V |
Subjects | |
Online Access | Get full text |
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Summary: | Carbon nanowall films with different thicknesses have been obtained by chemical deposition from a gas phase in a dc discharge. The thermal conductivity of the resulting structures has been measured for the first time using the 3ω method in the temperature range of 280–310 K. It has been shown that the thermal conductivity of walls depends on their thickness. The thermal conductivity of 1-μm carbon nanowalls is 6.9 W m
–1
K
–1
. The results obtained in this work are necessary to design electro-optical devices based on carbon nanowalls. |
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ISSN: | 0021-3640 1090-6487 |
DOI: | 10.1134/S0021364023600313 |