Charge trapping in surface accumulation layer of heavily doped junctionless nanowire transistors
We investigate the conductivity characteristics in the surface accumulation layer of a junctionless nanowire transistor fabricated by the femtosecond laser lithography on a heavily n-doped silicon-on-insulator wafer. The conductivity of the accumulation region is totally suppressed when the gate vol...
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| Published in | Chinese physics B Vol. 24; no. 12; pp. 587 - 591 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
01.12.2015
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| Subjects | |
| Online Access | Get full text |
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| Summary: | We investigate the conductivity characteristics in the surface accumulation layer of a junctionless nanowire transistor fabricated by the femtosecond laser lithography on a heavily n-doped silicon-on-insulator wafer. The conductivity of the accumulation region is totally suppressed when the gate voltage is more positive than the flatband voltage. The extracted low field electron mobility in the accumulation layer is estimated to be 1.25 cm^2·V^-1·s^-1. A time-dependent drain current measured at 6 K predicts the existence of a complex trap state at the Si–Si O2 interface within the bandgap. The suppressed drain current and comparable low electron mobility of the accumulation layer can be well described by the large Coulomb scattering arising from the presence of a large density of interface charged traps. The effects of charge trapping and the scattering at interface states become the main reasons for mobility reduction for electrons in the accumulation region. |
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| Bibliography: | We investigate the conductivity characteristics in the surface accumulation layer of a junctionless nanowire transistor fabricated by the femtosecond laser lithography on a heavily n-doped silicon-on-insulator wafer. The conductivity of the accumulation region is totally suppressed when the gate voltage is more positive than the flatband voltage. The extracted low field electron mobility in the accumulation layer is estimated to be 1.25 cm^2·V^-1·s^-1. A time-dependent drain current measured at 6 K predicts the existence of a complex trap state at the Si–Si O2 interface within the bandgap. The suppressed drain current and comparable low electron mobility of the accumulation layer can be well described by the large Coulomb scattering arising from the presence of a large density of interface charged traps. The effects of charge trapping and the scattering at interface states become the main reasons for mobility reduction for electrons in the accumulation region. 11-5639/O4 junctionless nanowire transistors,trap,femtosecond laser lithography,electron mobility ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
| ISSN: | 1674-1056 2058-3834 1741-4199 |
| DOI: | 10.1088/1674-1056/24/12/128101 |