Broadband time-resolved elliptical crystal spectrometer for X-ray spectroscopic measurements in laser-produced plasmas
The X-ray spectrometer used in high-energy-density plasma experiments generally requires both broad X-ray energy coverage and high temporal, spatial, and spectral resolutions for overcoming the difficulties imposed by the X-ray back- ground, debris, and mechanical shocks. By using an elliptical crys...
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| Published in | Chinese physics B Vol. 23; no. 11; pp. 257 - 260 |
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| Main Author | |
| Format | Journal Article |
| Language | English |
| Published |
01.11.2014
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| Subjects | |
| Online Access | Get full text |
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| Summary: | The X-ray spectrometer used in high-energy-density plasma experiments generally requires both broad X-ray energy coverage and high temporal, spatial, and spectral resolutions for overcoming the difficulties imposed by the X-ray back- ground, debris, and mechanical shocks. By using an elliptical crystal together with a streak camera, we resolve this issue at the SG-II laser facility. The carefully designed elliptical crystal has a broad spectral coverage with high resolution, strong rejection of the diffuse and/or fluorescent background radiation, and negligible source broadening for extended sources. The spectra that are Bragg reflected （23° 〈 θ 〈 38°） from the crystal are focused onto a streak camera slit 18 mm long and about 80 μm wide, to obtain a time-resolved spectrum. With experimental measurements, we demonstrate that the quartz（1011） elliptical analyzer at the SG-II laser facility has a single-shot spectral range of （4.64-6.45） keV, a typical spectral resolution of E/△E = 560, and an enhanced focusing power in the spectral dimension. For titanium （Ti） data, the lines of interest show a distribution as a function of time and the temporal variations of the He-α and Li-like Ti satellite lines and their spatial profiles show intensity peak red shifts. The spectrometer sensitivity is illustrated with a temporal resolution of better than 25 ps, which satisfies the near-term requirements of high-energy-density physics experiments. |
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| Bibliography: | X-ray spectrum, red shift, time-dependent phenomena Wang Rui-Rong , Jia Guo, Fang Zhi-Heng, Wang Wei, Meng Xlang-Fu, Xie Zhi-Yong, and Zhang Fan（ Shanghai Institute of Laser Plasma, Shanghai 201800, China） 11-5639/O4 The X-ray spectrometer used in high-energy-density plasma experiments generally requires both broad X-ray energy coverage and high temporal, spatial, and spectral resolutions for overcoming the difficulties imposed by the X-ray back- ground, debris, and mechanical shocks. By using an elliptical crystal together with a streak camera, we resolve this issue at the SG-II laser facility. The carefully designed elliptical crystal has a broad spectral coverage with high resolution, strong rejection of the diffuse and/or fluorescent background radiation, and negligible source broadening for extended sources. The spectra that are Bragg reflected （23° 〈 θ 〈 38°） from the crystal are focused onto a streak camera slit 18 mm long and about 80 μm wide, to obtain a time-resolved spectrum. With experimental measurements, we demonstrate that the quartz（1011） elliptical analyzer at the SG-II laser facility has a single-shot spectral range of （4.64-6.45） keV, a typical spectral resolution of E/△E = 560, and an enhanced focusing power in the spectral dimension. For titanium （Ti） data, the lines of interest show a distribution as a function of time and the temporal variations of the He-α and Li-like Ti satellite lines and their spatial profiles show intensity peak red shifts. The spectrometer sensitivity is illustrated with a temporal resolution of better than 25 ps, which satisfies the near-term requirements of high-energy-density physics experiments. ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 23 |
| ISSN: | 1674-1056 2058-3834 1741-4199 |
| DOI: | 10.1088/1674-1056/23/11/113201 |