Investigation of Adhesion Properties of Polymer Materials by Atomic Force Microscopy and Zeta Potential Measurements

AFM and zeta potential measurements were applied in order to investigate the influence of adsorption phenomena on the adhesion behavior of polymer materials. It is shown by means of zeta potential measurements that hydroxyl anions adsorb much stronger than chloride anions onto poly(etheretherketone)...

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Bibliographic Details
Published inJournal of colloid and interface science Vol. 180; no. 1; pp. 232 - 236
Main Authors Weidenhammer, Petra, Jacobasch, Hans-Jörg
Format Journal Article
LanguageEnglish
Published San Diego, CA Elsevier Inc 01.06.1996
Elsevier
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Summary:AFM and zeta potential measurements were applied in order to investigate the influence of adsorption phenomena on the adhesion behavior of polymer materials. It is shown by means of zeta potential measurements that hydroxyl anions adsorb much stronger than chloride anions onto poly(etheretherketone) surfaces. The adhesion forces between the PEEK surface and the silicon nitride tip of the AFM is lower in potassium hydroxide solution than in potassium chloride solution corresponding to the different adsorption free energies of the anions. For electrolyte concentrations above 0.5 mmol/liter no adhesive contact between tip and sample can be established. We propose an explanation based on the action of competitive forces in the system PEEK–electrolyte solution–Si3N4.
ISSN:0021-9797
1095-7103
DOI:10.1006/jcis.1996.0294