Pixel-level A/D conversion using voltage reset technique

This paper presents a 50 Hz 15-bit analog-to-digital converter (ADC) for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized fo...

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Published inJournal of semiconductors Vol. 35; no. 11; pp. 149 - 153
Main Author 李敏增 李福乐 张春 王志华
Format Journal Article
LanguageEnglish
Published 01.11.2014
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Abstract This paper presents a 50 Hz 15-bit analog-to-digital converter (ADC) for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized for low power, low noise and small area. An experimental chip with ten pixel-level ADCs has been fabricated and tested for verification. The measurement result shows a standard deviation of 1.8 LSB for full-scale output. The ADC has an area of 45 × 45μm^2 and consumes less than 2 μW in a standard 1P-6M 0.18μm CMOS process.
AbstractList This paper presents a 50 Hz 15-bit analog-to-digital converter (ADC) for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized for low power, low noise and small area. An experimental chip with ten pixel-level ADCs has been fabricated and tested for verification. The measurement result shows a standard deviation of 1.8 LSB for full-scale output. The ADC has an area of 45 × 45μm^2 and consumes less than 2 μW in a standard 1P-6M 0.18μm CMOS process.
This paper presents a 50 Hz 15-bit analog-to-digital converter (ADC) for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized for low power, low noise and small area. An experimental chip with ten pixel-level ADCs has been fabricated and tested for verification. The measurement result shows a standard deviation of 1.8 LSB for full-scale output. The ADC has an area of 45 x 45 [mu]m super(2) and consumes less than 2 [mu]W in a standard 1P-6M 0.18 [mu]m CMOS process.
Author 李敏增 李福乐 张春 王志华
AuthorAffiliation Institute of Microelectronics, Tsinghua University, Beijing 100084, China
Author_xml – sequence: 1
  fullname: 李敏增 李福乐 张春 王志华
BookMark eNqFkEtLAzEQgHOoYFv9C7J48rJupslms-Cl1CcU9KDnkI2zbSTNtpu06L83paUHL0IgZDLfPL4RGfjOIyFXQG-BSlmAqHjO64koWFkApFNSWg_I8PRxTkYhfFGa3hyGRL7Zb3S5wx26bFrcZ6bzO-yD7Xy2DdYvsl3nol5g1mPAmEU0S283W7wgZ612AS-P95h8PD68z57z-evTy2w6zw2DMuZsIiU0klNkpm2hoqhLkUZiWoq2ohpqXWKjIYWbhrf0E2pTcTAcW0MFRzYmN4e6675LbUNUKxsMOqc9dtugQFLKKymFSKl3h1TTdyH02Cpjo45pldhr6xRQtZek9i7U3oVipQJQB0kJF3_wdW9Xuv_5H7w-gsvOLzZJ2okUYlJTTsuK_QJc0Xm2
CitedBy_id crossref_primary_10_3390_s21072354
crossref_primary_10_1109_JSEN_2024_3523498
Cites_doi 10.1109/4.735552
10.1109/JSSC.2006.884866
10.1109/4.748186
10.1117/12.243528
10.1088/1674-4926/34/8/085016
ContentType Journal Article
DBID 2RA
92L
CQIGP
W92
~WA
AAYXX
CITATION
7SP
7U5
8FD
L7M
DOI 10.1088/1674-4926/35/11/115009
DatabaseName 维普期刊资源整合服务平台
中文科技期刊数据库-CALIS站点
维普中文期刊数据库
中文科技期刊数据库-工程技术
中文科技期刊数据库- 镜像站点
CrossRef
Electronics & Communications Abstracts
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Solid State and Superconductivity Abstracts
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
DocumentTitleAlternate Pixel-level A/D conversion using voltage reset technique
EndPage 153
ExternalDocumentID 10_1088_1674_4926_35_11_115009
662904057
GroupedDBID 02O
042
1WK
2B.
2C0
2RA
4.4
5B3
5VR
5VS
7.M
92H
92I
92L
92R
93N
AAGCD
AAJIO
AALHV
AATNI
ABHWH
ACAFW
ACGFO
ACGFS
ACHIP
AEFHF
AFUIB
AFYNE
AHSEE
AKPSB
ALMA_UNASSIGNED_HOLDINGS
ASPBG
AVWKF
AZFZN
BBWZM
CCEZO
CEBXE
CHBEP
CJUJL
CQIGP
CRLBU
CUBFJ
CW9
EBS
EDWGO
EJD
EQZZN
FA0
IJHAN
IOP
IZVLO
JCGBZ
KNG
KOT
M45
N5L
NS0
NT-
NT.
PJBAE
Q02
RIN
RNS
ROL
RPA
RW3
SY9
TCJ
TGT
W28
W92
~WA
-SI
-S~
5XA
5XJ
AAYXX
ACARI
AERVB
AGQPQ
AOAED
ARNYC
CAJEI
CITATION
Q--
TGMPQ
U1G
U5S
7SP
7U5
8FD
L7M
ID FETCH-LOGICAL-c315t-32881b840e3cff170ea560093a86f70a19a5eba1ea5bb4f0d19c741c4efc064e3
ISSN 1674-4926
IngestDate Fri Jul 11 09:37:50 EDT 2025
Tue Jul 01 03:20:29 EDT 2025
Thu Apr 24 23:03:09 EDT 2025
Wed Feb 14 10:33:58 EST 2024
IsPeerReviewed true
IsScholarly true
Issue 11
Language English
License http://iopscience.iop.org/info/page/text-and-data-mining
http://iopscience.iop.org/page/copyright
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c315t-32881b840e3cff170ea560093a86f70a19a5eba1ea5bb4f0d19c741c4efc064e3
Notes This paper presents a 50 Hz 15-bit analog-to-digital converter (ADC) for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized for low power, low noise and small area. An experimental chip with ten pixel-level ADCs has been fabricated and tested for verification. The measurement result shows a standard deviation of 1.8 LSB for full-scale output. The ADC has an area of 45 × 45μm^2 and consumes less than 2 μW in a standard 1P-6M 0.18μm CMOS process.
11-5781/TN
pixel-level analog-to-digital converter (ADC); voltage reset techniaue: low soeed and hieh resolution
Li Minzeng, Li Fule, Zhang Chun, Wang Zhihua( Institute of Microelectronics, Tsinghua University, Beijing 100084, China)
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
PQID 1800478866
PQPubID 23500
PageCount 5
ParticipantIDs proquest_miscellaneous_1800478866
crossref_citationtrail_10_1088_1674_4926_35_11_115009
crossref_primary_10_1088_1674_4926_35_11_115009
chongqing_primary_662904057
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2014-11-01
PublicationDateYYYYMMDD 2014-11-01
PublicationDate_xml – month: 11
  year: 2014
  text: 2014-11-01
  day: 01
PublicationDecade 2010
PublicationTitle Journal of semiconductors
PublicationTitleAlternate Chinese Journal of Semiconductors
PublicationYear 2014
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SSID ssj0067441
Score 1.9426179
Snippet This paper presents a 50 Hz 15-bit analog-to-digital converter (ADC) for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets...
This paper presents a 50 Hz 15-bit analog-to-digital converter (ADC) for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets...
SourceID proquest
crossref
chongqing
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 149
SubjectTerms Charge
CMOS
CMOS图像传感器
CMOS工艺
Consumption
Conversion
Electric potential
Semiconductors
Standard deviation
Voltage
像素级
复位
技术
数字转换器
标准偏差
电压
Title Pixel-level A/D conversion using voltage reset technique
URI http://lib.cqvip.com/qk/94689X/201411/662904057.html
https://www.proquest.com/docview/1800478866
Volume 35
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3di9QwEA96IuiD6Km4dyoVfFvqNk2bJo_LfXDKencPu7j4EtpscruwtHrbBbm_3pm0TffgxNOXUoZmCvMbJjPJfBDyUeg8LQDskEd2ESbUilBoakMby0RbIc0iwwLnr-f8bJZ8mafzftqbqy6pi0_65s66kv9BFWiAK1bJ_gOynikQ4B3whScgDM97YXy5-mXW4RrzfoZjYHPcJJG7E7Dh1p0CgPWpMS0Hq4zqoe_Y-gefdIOp8lWJPWCr_ppnsmoS7Msb0-5znggRrNcMf_Z8tNx6lfvW0r4vV8ttvnvGQJO22K43izxLQmwtuGs3mzYjnX7QO-0x2DA8GuiWwzvDXhbOSqMvGsl-H-ru3s8v1OlsMlHTk_n0IXkUg_-Poyk-X1x2WyywcyNJPd-u9BuieU8bsXRE6aj5C3bOWFbl1U-Q_G0P5PYG7LyK6XPyrBV9MG6wfUEemHKfPN1pErlPHrskXb15ScQO3sF4dBz0aAcO7aBFO3BoBx7tV2R2ejI9OgvbyRehZjStQxYLCCcg9jZMW0uzyOTomUqWC26zKKcyT02RUyAXRWKjBZUaXEOdGKvBxzTsNdkrq9K8IQETOs7iBdfS6ITzTGqhM0sZlzJhZmEH5NBLRv1oOpwozmMZoSs_IGknK6XbpvE4u2StXPKCEArlrVDeiqUQTqpG3gMy8us6pn9b8aGDQoGFw2urvDTVdqOowJamQnB-cI9vDsmTXoPfkr36emvegd9YF--dDv0GElZmwA
linkProvider IOP Publishing
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Pixel-level+A%2FD+conversion+using+voltage+reset+technique&rft.jtitle=Journal+of+semiconductors&rft.au=Li%2C+Minzeng&rft.au=Li%2C+Fule&rft.au=Zhang%2C+Chun&rft.au=Wang%2C+Zhihua&rft.date=2014-11-01&rft.issn=1674-4926&rft.volume=35&rft.issue=11&rft_id=info:doi/10.1088%2F1674-4926%2F35%2F11%2F115009&rft.externalDBID=NO_FULL_TEXT
thumbnail_s http://utb.summon.serialssolutions.com/2.0.0/image/custom?url=http%3A%2F%2Fimage.cqvip.com%2Fvip1000%2Fqk%2F94689X%2F94689X.jpg