Pixel-level A/D conversion using voltage reset technique

This paper presents a 50 Hz 15-bit analog-to-digital converter （ADC） for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized fo...

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Published inJournal of semiconductors Vol. 35; no. 11; pp. 149 - 153
Main Author 李敏增 李福乐 张春 王志华
Format Journal Article
LanguageEnglish
Published 01.11.2014
Subjects
Charge
CMOS
CMOS图像传感器
CMOS工艺
Consumption
Conversion
Electric potential
Semiconductors
Standard deviation
Voltage
像素级
复位
技术
数字转换器
标准偏差
电压
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Summary:This paper presents a 50 Hz 15-bit analog-to-digital converter （ADC） for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized for low power, low noise and small area. An experimental chip with ten pixel-level ADCs has been fabricated and tested for verification. The measurement result shows a standard deviation of 1.8 LSB for full-scale output. The ADC has an area of 45 × 45μm^2 and consumes less than 2 μW in a standard 1P-6M 0.18μm CMOS process.
Bibliography:This paper presents a 50 Hz 15-bit analog-to-digital converter （ADC） for pixel-level implementation in CMOS image sensors. The ADC is based on charge packets counting and adopts a voltage reset technique to inject charge packets. The core circuit for charge/pulse conversion is specially optimized for low power, low noise and small area. An experimental chip with ten pixel-level ADCs has been fabricated and tested for verification. The measurement result shows a standard deviation of 1.8 LSB for full-scale output. The ADC has an area of 45 × 45μm^2 and consumes less than 2 μW in a standard 1P-6M 0.18μm CMOS process.
11-5781/TN
pixel-level analog-to-digital converter （ADC）; voltage reset techniaue： low soeed and hieh resolution
Li Minzeng, Li Fule, Zhang Chun, Wang Zhihua（ Institute of Microelectronics, Tsinghua University, Beijing 100084, China）
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1674-4926
DOI:10.1088/1674-4926/35/11/115009