Composite behaviors of dual meminductor circuits

This paper focuses on analyzing the composite dynamic behaviors of two meminductors in serial and parallel connec- tions with different polarities. Based on the constitutive relations, two time-integral-of-flux (TIF) controlled meminductors are adopted to theoretically demonstrate the variation of m...

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Bibliographic Details
Published inChinese physics B Vol. 24; no. 11; pp. 180 - 195
Main Author 郑辞晏 于东升 梁燕 陈孟科
Format Journal Article
LanguageEnglish
Published 01.11.2015
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Summary:This paper focuses on analyzing the composite dynamic behaviors of two meminductors in serial and parallel connec- tions with different polarities. Based on the constitutive relations, two time-integral-of-flux (TIF) controlled meminductors are adopted to theoretically demonstrate the variation of memductance in terms of TIF, charge, flux, and current. By uti- lizing a floating memristor-less meminductor emulator, the theoretical analysis reported in this paper is confirmed via a PSPICE simulation study and hardware experiment. Good agreement among theoretical analysis, simulation, and hardware validation confirms that dual meminductor circuits in composite connections behave as a new meminductor with higher complexity.
Bibliography:This paper focuses on analyzing the composite dynamic behaviors of two meminductors in serial and parallel connec- tions with different polarities. Based on the constitutive relations, two time-integral-of-flux (TIF) controlled meminductors are adopted to theoretically demonstrate the variation of memductance in terms of TIF, charge, flux, and current. By uti- lizing a floating memristor-less meminductor emulator, the theoretical analysis reported in this paper is confirmed via a PSPICE simulation study and hardware experiment. Good agreement among theoretical analysis, simulation, and hardware validation confirms that dual meminductor circuits in composite connections behave as a new meminductor with higher complexity.
11-5639/O4
composite behavior, serial connection, parallel connection, meminductor
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/24/11/110701