APA (7th ed.) Citation

John, J. W., Mishra, A., Debbarma, R., Verzhbitskiy, I., & Goh, K. E. J. (2023). Probing charge traps at the 2D semiconductor/dielectric interface. Nanoscale, 15(42), 16818-16835. https://doi.org/10.1039/d3nr03453d

Chicago Style (17th ed.) Citation

John, John Wellington, Abhishek Mishra, Rousan Debbarma, Ivan Verzhbitskiy, and Kuan Eng Johnson Goh. "Probing Charge Traps at the 2D Semiconductor/dielectric Interface." Nanoscale 15, no. 42 (2023): 16818-16835. https://doi.org/10.1039/d3nr03453d.

MLA (9th ed.) Citation

John, John Wellington, et al. "Probing Charge Traps at the 2D Semiconductor/dielectric Interface." Nanoscale, vol. 15, no. 42, 2023, pp. 16818-16835, https://doi.org/10.1039/d3nr03453d.