Extraction of optimized parameters for Si0.6Ge0.4 material and SPP mode propagation through Si0.6Ge0.4/Ag/Si0.6Ge0.4 waveguide

The Lorentz model and modified Debye model （MDM） parameters forSi0.6Ge0.4 are presented. A nonlinear optimiza- tion algorithm is developed. The obtained parameters are used to determine the complex relative permittivity of Si0.6Ge0.4, and compared with the experimental data for validation. Finally t...

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Bibliographic Details
Published inOptoelectronics letters Vol. 9; no. 6; pp. 454 - 457
Main Authors Saber, Md. Ghulam, Sagor, Rakibul Hasan
Format Journal Article
LanguageEnglish
Published Berlin/Heidelberg Springer Berlin Heidelberg 01.11.2013
Subjects
Lasers
Optical Devices
Optics
Photonics
Physics
Physics and Astronomy
SPP模式
优化参数
传播
提取
材料
波导
相对介电常数
表面等离激元
Root Mean Square Deviation
Surface Plasmon Polariton
Surface Plasmon Polariton Mode
Electric Field Strength
Root Mean Square
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Summary:The Lorentz model and modified Debye model （MDM） parameters forSi0.6Ge0.4 are presented. A nonlinear optimiza- tion algorithm is developed. The obtained parameters are used to determine the complex relative permittivity of Si0.6Ge0.4, and compared with the experimental data for validation. Finally the obtained parameters are used to analyze the properties of symmetric surface plasmon polariton （SPP） mode propagation in a dielectric-metal-dielectric （DMD） material constructed with silver （Ag） and Si0.6Ge0.4 for further verifying the extracted parameters.
Bibliography:12-1370/TN
The Lorentz model and modified Debye model （MDM） parameters forSi0.6Ge0.4 are presented. A nonlinear optimiza- tion algorithm is developed. The obtained parameters are used to determine the complex relative permittivity of Si0.6Ge0.4, and compared with the experimental data for validation. Finally the obtained parameters are used to analyze the properties of symmetric surface plasmon polariton （SPP） mode propagation in a dielectric-metal-dielectric （DMD） material constructed with silver （Ag） and Si0.6Ge0.4 for further verifying the extracted parameters.
ISSN:1673-1905
1993-5013
DOI:10.1007/s11801-013-3152-x