Effects of high current density on lead-free solder joints of chip-size passive SMD components

• Published in: Soldering & surface mount technology Vol. 30; no. 2; pp. 74 - 80
• Main Authors: Geczy, Attila, Straubinger, Daniel, Kovacs, Andras, Krammer, Oliver, Mach, Pavel, Harsányi, Gábor
• Format: Journal Article
• Language: English
• Published: Bradford Emerald Publishing Limited 27.03.2018; Emerald Group Publishing Limited
• Subjects: Circuit boards; Circuit reliability; Contact angle; Copper; Critical current density; Electromigration; Experiments; Failure; Geometry; High current; High temperature; Inhomogeneity; Intermetallic compounds; Lead free; Mathematical analysis; Printed circuits; Shear tests; Software; Soldered joints; Solders; Surface-mounted devices; X ray microscopy; Electromigration; Lead-free soldering; Solder shape calculation; Chip-size components; Current density
• ISSN: 0954-0911; 1758-6836
• DOI: 10.1108/SSMT-10-2017-0032

Purpose The purpose of this paper is to present a novel approach on investigating critical current densities in the solder joints of chip-size surface mounted device (SMD) components. The investigation involves a numerical approach and a physical validation with selected track-to-pad connections and high current loads (CXs). Design/methodology/approach During the investigations, shape of solder fillets was calculated in Surface Evolver, and then the current densities were calculated accordingly in the given geometry. For the verification, CX tests were performed on joints at elevated temperatures. The joints were qualified with X-ray microscopy, cross-section analysis and shear tests. Findings This study ascertained that the inhomogeneity in current density depends on the track-to-pad structure of the joint. Also this study found that the heavy CX decreases the mechanical strength, but the degradation does not reach the level of electromigration (EM)-induced voiding. Practical implications The heavy CX significantly affects joint reliability and the results point out to EM-induced failure-limitations on printed circuit board (PCB)-based assemblies due to the thermomechanical weakness of the FR4 material. Originality/value The experiments investigate current density from a novel aspect on more frequently used small-scale components with different track-to-pad configurations – pointing out possible failure sources.