Fermi level depinning by a C-containing layer in a metal/Ge structure by using a chemical bath
Insertion of a C-containing layer in a metal/Ge structure,using a chemical bath,enabled the Schottky barrier height(SBH) to be modulated.Chemical baths with 1-octadecene,1-hexadecene,1-tetradecene,and 1- dodecene were used separately with Ge substrates.An ultrathin C-containing layer stops the penet...
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Published in | Journal of semiconductors Vol. 33; no. 10; pp. 16 - 20 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
01.10.2012
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Subjects | |
Online Access | Get full text |
ISSN | 1674-4926 |
DOI | 10.1088/1674-4926/33/10/102004 |
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Summary: | Insertion of a C-containing layer in a metal/Ge structure,using a chemical bath,enabled the Schottky barrier height(SBH) to be modulated.Chemical baths with 1-octadecene,1-hexadecene,1-tetradecene,and 1- dodecene were used separately with Ge substrates.An ultrathin C-containing layer stops the penetration of free electron wave functions from the metal to the Ge.Metal-induced gap states are alleviated and the pinned Fermi level is released.The SBH is lowered to 0.17 eV.This new formation method is much less complex than traditional ones,and the result is very good. |
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Bibliography: | Wang Wei,Wang Jing,Zhao Mei,Liang Renrong and Xu Jun Institute of Microelectronics,Tsinghua University,Beijing 100084,China 11-5781/TN Insertion of a C-containing layer in a metal/Ge structure,using a chemical bath,enabled the Schottky barrier height(SBH) to be modulated.Chemical baths with 1-octadecene,1-hexadecene,1-tetradecene,and 1- dodecene were used separately with Ge substrates.An ultrathin C-containing layer stops the penetration of free electron wave functions from the metal to the Ge.Metal-induced gap states are alleviated and the pinned Fermi level is released.The SBH is lowered to 0.17 eV.This new formation method is much less complex than traditional ones,and the result is very good. Schottky barrier; Fermi level pinning; chemical bath; blocking layer ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1674-4926 |
DOI: | 10.1088/1674-4926/33/10/102004 |