Phonon contribution to nonionizing energy loss in silicon detectors

Nonionizing energy loss（NIEL） has been applied to a number of studies concerning displacement damage effects in materials and devices. However, most studies consider only the contribution of displacement damage effects,neglecting the contribution from phonons. In this paper, a NIEL model, which cons...

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Bibliographic Details
Published inChinese physics C Vol. 39; no. 6; pp. 81 - 84
Main Author 李荣华 李占奎 杨磊 李冬梅 李海霞 王柱生 陈翠红 谭继廉 刘凤琼 戎欣娟 王秀华 李春艳 祖凯铃 卢子伟
Format Journal Article
LanguageEnglish
Published 01.06.2015
Subjects
Damage
Detectors
Displacement
Equivalence
Fluence
Irradiation
NIEL
Phonons
Silicon
SRIM
声子
损伤效应
电离能量损失
硅探测器
能量密度
蒙特卡洛
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ISSN1674-1137
0254-3052
DOI10.1088/1674-1137/39/6/066004

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Summary:Nonionizing energy loss（NIEL） has been applied to a number of studies concerning displacement damage effects in materials and devices. However, most studies consider only the contribution of displacement damage effects,neglecting the contribution from phonons. In this paper, a NIEL model, which considers the contribution of phonons,has been established using the Monte Carlo code SRIM. The maximum endurable fluence for silicon detectors has been estimated using the equivalent irradiation fluence compared with experimental data for the incident particles.NIEL is proportional to the equivalent irradiation fluence that the detector has received.
Bibliography:11-5641/O4
irradiation concerning incident proportional phonon convert files decreasing constants reaches
Nonionizing energy loss（NIEL） has been applied to a number of studies concerning displacement damage effects in materials and devices. However, most studies consider only the contribution of displacement damage effects,neglecting the contribution from phonons. In this paper, a NIEL model, which considers the contribution of phonons,has been established using the Monte Carlo code SRIM. The maximum endurable fluence for silicon detectors has been estimated using the equivalent irradiation fluence compared with experimental data for the incident particles.NIEL is proportional to the equivalent irradiation fluence that the detector has received.
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ISSN:1674-1137
0254-3052
DOI:10.1088/1674-1137/39/6/066004