Oscillator phase noise measurements by picosecond synchroscan streak camera

A new method/spl minus/with picosecond resolution/spl minus/allowing the recording of the instantaneous time phase fluctuations of a crystal controlled oscillator is presented. The oscillator under test drives the acoustooptic modelocker of a CW Nd:YAG laser associated with a synchronously pumped dy...

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Bibliographic Details
Published inIEEE transactions on ultrasonics, ferroelectrics, and frequency control Vol. 41; no. 2; pp. 275 - 278
Main Authors Cunin, B., Eckert, C., Haessler, A., Heisel, F., Miehe, J.A., Planat, M.
Format Journal Article
LanguageEnglish
Published IEEE 01.03.1994
Institute of Electrical and Electronics Engineers
Subjects
Acoustic testing
Fluctuations
Instrumentation and Detectors
Laser excitation
Laser modes
Laser noise
Noise measurement
Oscillators
Phase measurement
Phase noise
Physics
Pump lasers
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Summary:A new method/spl minus/with picosecond resolution/spl minus/allowing the recording of the instantaneous time phase fluctuations of a crystal controlled oscillator is presented. The oscillator under test drives the acoustooptic modelocker of a CW Nd:YAG laser associated with a synchronously pumped dye laser. By means of a streak camera illuminated by the ps dye laser pulses and synchronized by the oscillator signal the statistics of its zero crossings is analyzed.< >
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0885-3010
1525-8955
DOI:10.1109/58.279143