宋睿强, 于. 陈. 陈. 黄. (2016). Effect of supply voltage and body-biasing on single-event transient pulse quenching in bulk fin field-effect-transistor process. Chinese physics B, 25(4), 495-500. https://doi.org/10.1088/1674-1056/25/4/049401
Chicago Style (17th ed.) Citation宋睿强, 于俊庭 陈书明 陈建军 黄鹏程. "Effect of Supply Voltage and Body-biasing on Single-event Transient Pulse Quenching in Bulk Fin Field-effect-transistor Process." Chinese Physics B 25, no. 4 (2016): 495-500. https://doi.org/10.1088/1674-1056/25/4/049401.
MLA (9th ed.) Citation宋睿强, 于俊庭 陈书明 陈建军 黄鹏程. "Effect of Supply Voltage and Body-biasing on Single-event Transient Pulse Quenching in Bulk Fin Field-effect-transistor Process." Chinese Physics B, vol. 25, no. 4, 2016, pp. 495-500, https://doi.org/10.1088/1674-1056/25/4/049401.