Effect of supply voltage and body-biasing on single-event transient pulse quenching in bulk fin field-effect-transistor process

Charge sharing is becoming an important topic as the feature size scales down in fin field-effect-transistor （FinFET） technology. However, the studies of charge sharing induced single-event transient （SET） pulse quenching with bulk FinFET are reported seldomly. Using three-dimensional technology com...

Full description

Saved in:
Bibliographic Details
Published inChinese physics B Vol. 25; no. 4; pp. 495 - 500
Main Author 于俊庭 陈书明 陈建军 黄鹏程 宋睿强
Format Journal Article
LanguageEnglish
Published 01.04.2016
Subjects
Charge
Circuits
Electric potential
FinFET
Propagation
Pulse width
Quenching
Three dimensional
Voltage
低电源电压
偏置
单粒子
场效应晶体管
猝灭
瞬态脉冲
计算机辅助设计技术
Online AccessGet full text

Cover

More Information
Summary:Charge sharing is becoming an important topic as the feature size scales down in fin field-effect-transistor （FinFET） technology. However, the studies of charge sharing induced single-event transient （SET） pulse quenching with bulk FinFET are reported seldomly. Using three-dimensional technology computer aided design （3DTCAD） mixed-mode simulations, the effects of supply voltage and body-biasing on SET pulse quenching are investigated for the first time in bulk FinFET process. Research results indicate that due to an enhanced charge sharing effect, the propagating SET pulse width decreases with reducing supply voltage. Moreover, compared with reverse body-biasing （RBB）, the circuit with forward body-biasing （FBB） is vulnerable to charge sharing and can effectively mitigate the propagating SET pulse width up to 53% at least. This can provide guidance for radiation-hardened bulk FinFET technology especially in low power and high performance applications.
Bibliography:body-biasing, SET pulse quenching, charge sharing, bulk FinFET process
Charge sharing is becoming an important topic as the feature size scales down in fin field-effect-transistor （FinFET） technology. However, the studies of charge sharing induced single-event transient （SET） pulse quenching with bulk FinFET are reported seldomly. Using three-dimensional technology computer aided design （3DTCAD） mixed-mode simulations, the effects of supply voltage and body-biasing on SET pulse quenching are investigated for the first time in bulk FinFET process. Research results indicate that due to an enhanced charge sharing effect, the propagating SET pulse width decreases with reducing supply voltage. Moreover, compared with reverse body-biasing （RBB）, the circuit with forward body-biasing （FBB） is vulnerable to charge sharing and can effectively mitigate the propagating SET pulse width up to 53% at least. This can provide guidance for radiation-hardened bulk FinFET technology especially in low power and high performance applications.
11-5639/O4
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/25/4/049401