Demonstration of in-depth analysis of silicon photonics circuits using OFDR: waveguides with grating couplers
Optical frequency domain reflectometry (OFDR) is a powerful technique to investigate backscatter in waveguides. However, its use in Si photonics circuits has so far been limited to measuring the propagation loss and group index of a waveguide. We demonstrate that the transmittance (T) and reflectanc...
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| Published in | Optics letters Vol. 47; no. 1; p. 162 |
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| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
United States
01.01.2022
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| Online Access | Get more information |
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| Summary: | Optical frequency domain reflectometry (OFDR) is a powerful technique to investigate backscatter in waveguides. However, its use in Si photonics circuits has so far been limited to measuring the propagation loss and group index of a waveguide. We demonstrate that the transmittance (T) and reflectance (R) of elemental devices comprising a Si photonics circuit can be determined by OFDR. An analysis of Si wire waveguides with grating couplers (GCs) is described in detail. The wavelength dependence of T and R of the GCs were determined by using a backscatter model incorporating time-equivalent multiple-reflection paths and were well reproduced by a numerical simulation. |
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| ISSN: | 1539-4794 |
| DOI: | 10.1364/OL.444876 |