Characterization of Femtosecond Laser-Induced Plasma under Low Pressure in Argon

An experiment of femtosecond laser-induced breakdown in argon with a pressure below normal atmospheric pressure is performed. The breakdown spectrum is mainly due to the electronic relaxation of excited Ar atoms and Ar ions. The lifetimes and characteristics of the Ar plasma are extensively studied...

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Published inChinese physics letters Vol. 32; no. 3; pp. 78 - 81
Main Author 曹瑜 刘小亮 冼文多 孙少华 孙铭泽 丁鹏基 史彦超 刘作业 胡碧涛
Format Journal Article
LanguageEnglish
Published 01.03.2015
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Summary:An experiment of femtosecond laser-induced breakdown in argon with a pressure below normal atmospheric pressure is performed. The breakdown spectrum is mainly due to the electronic relaxation of excited Ar atoms and Ar ions. The lifetimes and characteristics of the Ar plasma are extensively studied by the time-integrated and time-resolved optical emission spectroscopy technique, which is also discussed. Under the assumption of local thermodynamic equilibrium (LTE), the plasma temperature is calculated. Moreover, the electron density is accessed from the Stark broadening of the ionized argon lines. Finally, the validity of applications of LTE is also discussed.
Bibliography:CAO Yu, LIU Xiao-Liang, XIAN Wen-Duo, SUN Shao-Hua,SUN Ming-Ze, DiNG Peng-ai, SHI Yan-Chao, LIU Zuo-Ye, HU Bi-Tao(School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000)
11-1959/O4
An experiment of femtosecond laser-induced breakdown in argon with a pressure below normal atmospheric pressure is performed. The breakdown spectrum is mainly due to the electronic relaxation of excited Ar atoms and Ar ions. The lifetimes and characteristics of the Ar plasma are extensively studied by the time-integrated and time-resolved optical emission spectroscopy technique, which is also discussed. Under the assumption of local thermodynamic equilibrium (LTE), the plasma temperature is calculated. Moreover, the electron density is accessed from the Stark broadening of the ionized argon lines. Finally, the validity of applications of LTE is also discussed.
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
ISSN:0256-307X
1741-3540
DOI:10.1088/0256-307X/32/3/035203