Electronic transport properties of silicon junctionless nanowire transistors fabricated by femtosecond laser direct writing

Silicon junctionless nanowire transistor(JNT) is fabricated by femtosecond laser direct writing on a heavily n-doped SOI substrate.The performances of the transistor,i.e.,current drive,threshold voltage,subthreshold swing(SS),and electron mobility are evaluated.The device shows good gate control abi...

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Published inChinese physics B Vol. 25; no. 6; pp. 552 - 556
Main Author 马刘红 韩伟华 王昊 吕奇峰 张望 杨香 杨富华
Format Journal Article
LanguageEnglish
Published 01.06.2016
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Abstract Silicon junctionless nanowire transistor(JNT) is fabricated by femtosecond laser direct writing on a heavily n-doped SOI substrate.The performances of the transistor,i.e.,current drive,threshold voltage,subthreshold swing(SS),and electron mobility are evaluated.The device shows good gate control ability and low-temperature instability in a temperature range from 10 K to 300 K.The drain currents increasing by steps with the gate voltage are clearly observed from 10 K to50 K,which is attributed to the electron transport through one-dimensional(1D) subbands formed in the nanowire.Besides,the device exhibits a better low-field electron mobility of 290 cm2·V-1·s-1,implying that the silicon nanowires fabricated by femtosecond laser have good electrical properties.This approach provides a potential application for nanoscale device patterning.
AbstractList Silicon junctionless nanowire transistor (JNT) is fabricated by femtosecond laser direct writing on a heavily n-doped SOI substrate. The performances of the transistor, i.e., current drive, threshold voltage, subthreshold swing (SS), and electron mobility are evaluated. The device shows good gate control ability and low-temperature instability in a temperature range from 10 K to 300 K. The drain currents increasing by steps with the gate voltage are clearly observed from 10 K to 50 K, which is attributed to the electron transport through one-dimensional (1D) subbands formed in the nanowire. Besides, the device exhibits a better low-field electron mobility of 290 cm super(2).V super(-1).s super(-1), implying that the silicon nanowires fabricated by femtosecond laser have good electrical properties. This approach provides a potential application for nanoscale device patterning.
Silicon junctionless nanowire transistor(JNT) is fabricated by femtosecond laser direct writing on a heavily n-doped SOI substrate.The performances of the transistor,i.e.,current drive,threshold voltage,subthreshold swing(SS),and electron mobility are evaluated.The device shows good gate control ability and low-temperature instability in a temperature range from 10 K to 300 K.The drain currents increasing by steps with the gate voltage are clearly observed from 10 K to50 K,which is attributed to the electron transport through one-dimensional(1D) subbands formed in the nanowire.Besides,the device exhibits a better low-field electron mobility of 290 cm2·V-1·s-1,implying that the silicon nanowires fabricated by femtosecond laser have good electrical properties.This approach provides a potential application for nanoscale device patterning.
Author 马刘红 韩伟华 王昊 吕奇峰 张望 杨香 杨富华
AuthorAffiliation Engineering Research Center for Semiconductor Integration Technology,Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
Author_xml – sequence: 1
  fullname: 马刘红 韩伟华 王昊 吕奇峰 张望 杨香 杨富华
BookMark eNqFkDtrHDEURoVxwGsnPyEgUqWZrB6jx-DKGDsxGNIktdBorjYys9JaV4sx-fOZZRcXaVzd5pwL37kk57lkIOQzZ984s3bNtek7zpReC7XWa6YtZ_KMrARTtpNW9udk9cZckEvEJ8Y0Z0KuyN-7GUKrJadAW_UZd6U2uqtlB7UlQFoixTSnUDJ92ufQUskzINLsc3lJFY5WwlYq0ujHmoJvMNHxlUbYtoKwqBOdPUKl0yKERl9qailvPpIP0c8In073ivy-v_t1-6N7_Pn94fbmsQuSy9ZpqcwgezMqa_toFfTGW69MHMwkgjSCcTBsVNMwjizyyI3uASYte72AsZdX5Ovx7zLreQ_Y3DZhgHn2GcoeHbdCKanNwBf0-oiGWhArRBdS84fRy8w0O87cIbk75HSHnE4op90x-WKr_-xdTVtfX9_1vpy8PyVvnpc0b6LWdjBSCSH_Ac-7lUM
CitedBy_id crossref_primary_10_1088_1674_4926_39_6_061003
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ContentType Journal Article
DBID 2RA
92L
CQIGP
~WA
AAYXX
CITATION
7U5
8FD
H8D
L7M
DOI 10.1088/1674-1056/25/6/068103
DatabaseName 维普期刊资源整合服务平台
中文科技期刊数据库-CALIS站点
中文科技期刊数据库-7.0平台
中文科技期刊数据库- 镜像站点
CrossRef
Solid State and Superconductivity Abstracts
Technology Research Database
Aerospace Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Aerospace Database
Solid State and Superconductivity Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitleList Aerospace Database

DeliveryMethod fulltext_linktorsrc
Discipline Physics
DocumentTitleAlternate Electronic transport properties of silicon junctionless nanowire transistors fabricated by femtosecond laser direct writing
EISSN 2058-3834
1741-4199
EndPage 556
ExternalDocumentID 10_1088_1674_1056_25_6_068103
668973522
GroupedDBID 02O
1JI
1WK
29B
2RA
4.4
5B3
5GY
5VR
5VS
5ZH
6J9
7.M
7.Q
92L
AAGCD
AAJIO
AAJKP
AALHV
AATNI
ABHWH
ABJNI
ABQJV
ACAFW
ACGFS
ACHIP
AEFHF
AENEX
AFUIB
AFYNE
AHSEE
AKPSB
ALMA_UNASSIGNED_HOLDINGS
ASPBG
ATQHT
AVWKF
AZFZN
BBWZM
CCEZO
CCVFK
CEBXE
CHBEP
CJUJL
CQIGP
CRLBU
CS3
DU5
EBS
EDWGO
EJD
EMSAF
EPQRW
EQZZN
FA0
FEDTE
HAK
HVGLF
IJHAN
IOP
IZVLO
JCGBZ
KNG
KOT
M45
N5L
NT-
NT.
PJBAE
Q02
RIN
RNS
ROL
RPA
RW3
SY9
TCJ
TGP
UCJ
W28
~WA
-SA
-S~
AAYXX
ACARI
ADEQX
AERVB
AGQPQ
AOAED
ARNYC
CAJEA
CITATION
Q--
U1G
U5K
7U5
8FD
AEINN
H8D
L7M
ID FETCH-LOGICAL-c313t-63579347b5884f85e47a8a57f97d2c37201e70b5d9bb0f1f1764eed63467a8f43
ISSN 1674-1056
IngestDate Tue Aug 05 10:11:23 EDT 2025
Tue Jul 01 02:55:16 EDT 2025
Thu Apr 24 23:08:15 EDT 2025
Wed Feb 14 10:18:59 EST 2024
IsPeerReviewed true
IsScholarly true
Issue 6
Language English
License http://iopscience.iop.org/info/page/text-and-data-mining
http://iopscience.iop.org/page/copyright
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c313t-63579347b5884f85e47a8a57f97d2c37201e70b5d9bb0f1f1764eed63467a8f43
Notes Silicon junctionless nanowire transistor(JNT) is fabricated by femtosecond laser direct writing on a heavily n-doped SOI substrate.The performances of the transistor,i.e.,current drive,threshold voltage,subthreshold swing(SS),and electron mobility are evaluated.The device shows good gate control ability and low-temperature instability in a temperature range from 10 K to 300 K.The drain currents increasing by steps with the gate voltage are clearly observed from 10 K to50 K,which is attributed to the electron transport through one-dimensional(1D) subbands formed in the nanowire.Besides,the device exhibits a better low-field electron mobility of 290 cm2·V-1·s-1,implying that the silicon nanowires fabricated by femtosecond laser have good electrical properties.This approach provides a potential application for nanoscale device patterning.
Liu-Hong Ma,Wei-Hua Han,Hao Wang,Qi-feng Lyu,Wang Zhang,Xiang Yang,Fu-Hua Yang
junctionless nanowire transistor;femtosecond laser lithography;electron mobility;quantum transport
11-5639/O4
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 23
PQID 1825536791
PQPubID 23500
PageCount 5
ParticipantIDs proquest_miscellaneous_1825536791
crossref_citationtrail_10_1088_1674_1056_25_6_068103
crossref_primary_10_1088_1674_1056_25_6_068103
chongqing_primary_668973522
ProviderPackageCode CITATION
AAYXX
PublicationCentury 2000
PublicationDate 2016-06-01
PublicationDateYYYYMMDD 2016-06-01
PublicationDate_xml – month: 06
  year: 2016
  text: 2016-06-01
  day: 01
PublicationDecade 2010
PublicationTitle Chinese physics B
PublicationTitleAlternate Chinese Physics
PublicationYear 2016
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SSID ssj0061023
ssib054405859
ssib000804704
Score 2.0762851
Snippet Silicon junctionless nanowire transistor(JNT) is fabricated by femtosecond laser direct writing on a heavily n-doped SOI substrate.The performances of the...
Silicon junctionless nanowire transistor (JNT) is fabricated by femtosecond laser direct writing on a heavily n-doped SOI substrate. The performances of the...
SourceID proquest
crossref
chongqing
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 552
SubjectTerms Devices
Electron transport
Femtosecond
Gates
Nanowires
Semiconductor devices
Silicon substrates
Transistors
制作
晶体管
栅极电压
激光直写
电子输运性质
电子迁移率
硅纳米线
飞秒激光
Title Electronic transport properties of silicon junctionless nanowire transistors fabricated by femtosecond laser direct writing
URI http://lib.cqvip.com/qk/85823A/201606/668973522.html
https://www.proquest.com/docview/1825536791
Volume 25
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV1Lb9QwELbaRUhcEE-xFJCRmFOUbl527GOyzaog8Ti0Um9RnE2gqGQLuysE_HlmnNdWRbwukdexx1HmW8_YGX_D2IsY3fhK-5UrKlW5UVnWrjG1dFVREYG5MNLu6b5-I49Po1dn4mxvf7ITtbTdmMPy-y_PlfyPVrEO9UqnZP9Bs4NQrMAy6hevqGG8_pWOszGHzaYnKaeIq0sKlm7ZZNfnF6jrxvmI9styetPM1hTNijiK216WKGTt1IWxKYNal7SuPm1Wa1otLx10sCmPuJ0cna_EgtSZu86phSyCVEFyBJkAnUKKhRiUhkRTQXugZArZAtI56AQyBQob-ZBJ0BJU3LVWQ1QtZLZvMieBSoFW1CRNIAkcuqcXVnRkBS5soyNQmWMFZSSdROMwiWMfyQMtqJAIO5qANITUs_dQQuLZ5igqdWzpCBJlHwHLercKJSxAzYcBd7dMfDmGdnWzvIwjtD-i4-C2dYEnlBv2O6vn12Z20RLtdk6CaPtesz84Z9NWSC-fjtsQd4f9RkbMb-FododgSCmVjskP3mc3AlzsUB6Ol2_f9f6EJHIN2jbohfbn0JSaDXWzQMzkrB2CWEI-rJr3nxEMV72tq86G9aBO7rDb3dKHJy2O77K9qrnHbtoQ5HJ9n_0Y0cwHNPMRzXxV8w7NfBfNvEcz30EzH9HMzTe-g2Zu0cxbNPMOzQ_Y6SI7mR-7XWoQtwz9cOMSi6IOo9jQOetaiSqKC1WIuNbxMigp85JfxZ4RS22MV_u1H8sIvUEZol9QqDoKH7JJs2qqR4wXS116Ba6qNXqztfFUaUL86aMtjExYh1N2MLzO_LKlgMkHnU1Z1L_gvOxY9Sm5y0VuozuUyklHOekoD0Qu81ZHU3Y4dOtl_qHD8157ORoA-qpXNNVqu859FQgRylj7j3_7pAfs1vhfeMImmy_b6ik61BvzzOLtJ4ruq0o
linkProvider IOP Publishing
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Electronic+transport+properties+of+silicon+junctionless+nanowire+transistors+fabricated+by+femtosecond+laser+direct+writing&rft.jtitle=%E4%B8%AD%E5%9B%BD%E7%89%A9%E7%90%86B%EF%BC%9A%E8%8B%B1%E6%96%87%E7%89%88&rft.au=%E9%A9%AC%E5%88%98%E7%BA%A2+%E9%9F%A9%E4%BC%9F%E5%8D%8E+%E7%8E%8B%E6%98%8A+%E5%90%95%E5%A5%87%E5%B3%B0+%E5%BC%A0%E6%9C%9B+%E6%9D%A8%E9%A6%99+%E6%9D%A8%E5%AF%8C%E5%8D%8E&rft.date=2016-06-01&rft.issn=1674-1056&rft.eissn=2058-3834&rft.issue=6&rft.spage=552&rft.epage=556&rft_id=info:doi/10.1088%2F1674-1056%2F25%2F6%2F068103&rft.externalDocID=668973522
thumbnail_s http://utb.summon.serialssolutions.com/2.0.0/image/custom?url=http%3A%2F%2Fimage.cqvip.com%2Fvip1000%2Fqk%2F85823A%2F85823A.jpg