Enhanced Depth of Lift-off Pattern Defined with Soft Mold Ultraviolet Nanoimprint by Multi-Layer Masks
The traditional lift-off process can hardly be carried out in ultraviolet nanoimprint defined patterns due to the poor solubility of the ultraviolet resist. Moreover, the depth of lift-off pattern defined by an ultraviolet nanoimprint is limited by that of the soft mold. In this work, a modified nan...
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Published in | Chinese physics letters Vol. 31; no. 8; pp. 160 - 162 |
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Main Author | |
Format | Journal Article |
Language | English |
Published |
01.08.2014
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Subjects | |
Online Access | Get full text |
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