Enhanced Depth of Lift-off Pattern Defined with Soft Mold Ultraviolet Nanoimprint by Multi-Layer Masks

The traditional lift-off process can hardly be carried out in ultraviolet nanoimprint defined patterns due to the poor solubility of the ultraviolet resist. Moreover, the depth of lift-off pattern defined by an ultraviolet nanoimprint is limited by that of the soft mold. In this work, a modified nan...

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Bibliographic Details
Published inChinese physics letters Vol. 31; no. 8; pp. 160 - 162
Main Author 王智浩 刘文 左强 王磊 赵彦立 徐智谋
Format Journal Article
LanguageEnglish
Published 01.08.2014
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