Synthetic dynamic test of base line popping noise in recording heads

• Published in: Journal of magnetism and magnetic materials Vol. 316; no. 2; pp. 192 - 194
• Main Authors: Siritaratiwat, A., Phochai, O., Tangchaichit, K., Ung-arunyawee, R., Sivaratana, R., Nutter, P.W.
• Format: Journal Article Conference Proceeding
• Language: English
• Published: Amsterdam Elsevier B.V 01.09.2007; Elsevier Science
• Subjects: Barkhausen noise; Base line popping noise; Condensed matter: electronic structure, electrical, magnetic, and optical properties; ESD; Exact sciences and technology; Giant magnetoresistance; GMR; Magnetic properties and materials; Magnetic recording materials; Magnetotransport phenomena, materials for magnetotransport; Physics; Studies of specific magnetic materials; 75.50.Ss; Barkhausen noise; Base line popping noise; 85.70.Ay; GMR; ESD; Dynamic testing; Signal-to-noise ratio; Magnetic hysteresis; Instability; Giant magnetoresistance; Recording material; 75.50.Ss; 85.70.Ay; Barkhausen effect; Base line popping noise; GMR; ESD; Barkhausen noise
• ISSN: 0304-8853
• DOI: 10.1016/j.jmmm.2007.02.064

This paper examines the Base Line Popping Noise (BLPN) test that is used for inspection of instability and electrostatic discharge (ESD) related parameters. The conventional BLPN measurement is performed only by a dynamic tester and shown numerically. A novel BLPN method which is characterized by a synthetic dynamic test under static control is proposed. The results, compared with a conventional one, show that BLPN is thoroughly sensitive to examined parameters such as bias current, operating frequency and ESD zapping voltage. Some hysteresis loop clearly shows the occurrence of BLPN due to Barkhausen jumps which are undetectable by using a typical dynamic tester.