Subsurface treatment of a contact subjected to a hertz pressure

The study proposes an approach allowing the favorable modification of the stresses field of a structure subjected to a Hertzian contact. It is based on the study of a classic Hertzian contact in the presence of subsurface circular defects. The idea is to limit the field of tangential stresses withou...

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Bibliographic Details
Published inInternational journal of mechanical sciences Vol. 77; pp. 107 - 112
Main Authors Palade, A.-C., Pillon, G.-P., Cicala, E., Grevey, D., Marsavina, L.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.12.2013
Subjects
Hertzian contact
Numerical simulation
Photoelasticity
Shearing stress decreasing
Subsurface treatment
Shearing stress decreasing
Photoelasticity
Numerical simulation
Subsurface treatment
Hertzian contact
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Summary:The study proposes an approach allowing the favorable modification of the stresses field of a structure subjected to a Hertzian contact. It is based on the study of a classic Hertzian contact in the presence of subsurface circular defects. The idea is to limit the field of tangential stresses without large increasing of the global stress (Von Mises) of the system. The location of the defects is made according to the mechanical parameters of the contact (Fn, has, z). The results of the numerical calculations (FEM) are compared with photoelastic measurements and highlight an excellent correlation. The location of the defect on the symmetry axis (x=0) is the dominating parameter for the tangential stress decreasing. •Interest of subsurface treatment of a contact subjected to a hertz pressure.•Subsurface treatment allows to decrease shearing stress.•Subsurface holes location allows to ameliorate hertz contact.
ISSN:0020-7403
1879-2162
DOI:10.1016/j.ijmecsci.2013.08.013