Near-field properties of diffraction through a circular subwavelength-size aperture

Analytical nonparaxial vectorial electric field expressions for both Gaussian beams and plane waves diffracted through a circular aperture are derived by using the vector plane angular spectrum method for the first time, which is suitable for the subwavelength aperture and the near-field region. The...

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Bibliographic Details
Published inChinese physics B Vol. 21; no. 6; pp. 188 - 199
Main Author 王正岭 周明 高传玉 张伟
Format Journal Article
LanguageEnglish
Published 01.06.2012
Subjects
Apertures
Circularity
Diffraction
Evolution
Gaussian beams (optics)
Mathematical analysis
Plane waves
Propagation
Vectors (mathematics)
亚波长
传播距离
光圈
圆形
尺寸
衍射特性
近场光学显微镜
近场区
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ISSN1674-1056
2058-3834
1741-4199
DOI10.1088/1674-1056/21/6/064202

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Summary:Analytical nonparaxial vectorial electric field expressions for both Gaussian beams and plane waves diffracted through a circular aperture are derived by using the vector plane angular spectrum method for the first time, which is suitable for the subwavelength aperture and the near-field region. The transverse properties of intensity distributions and their evolutions with the propagating distance, and the power transmission functions for diffracted fields containing the whole field, the evanescent field and the propagating field are investigated in detail, which is helpful for understanding the relationship between evanescent and propagating components in the near-field region and can be applied to apertured near-field scanning optical microscopy.
Bibliography:analytical expressions, diffraction, circular subwavelength aperture, near-field properties
Wang Zheng-Ling, Zhou Ming, Gao Chuan-Yu, and Zhang Wei（a） School of Materials Science and Engineering, Jiangsu University, Zhenjiang 212013, China b） Department of Physics, Jiangsu University, Zhenjiang 212013, China
11-5639/O4
Analytical nonparaxial vectorial electric field expressions for both Gaussian beams and plane waves diffracted through a circular aperture are derived by using the vector plane angular spectrum method for the first time, which is suitable for the subwavelength aperture and the near-field region. The transverse properties of intensity distributions and their evolutions with the propagating distance, and the power transmission functions for diffracted fields containing the whole field, the evanescent field and the propagating field are investigated in detail, which is helpful for understanding the relationship between evanescent and propagating components in the near-field region and can be applied to apertured near-field scanning optical microscopy.
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ISSN:1674-1056
2058-3834
1741-4199
DOI:10.1088/1674-1056/21/6/064202