Bit-Error-Rate Monitoring for Active Wavelength Control of Resonant Modulators

A new method uses bit-error-rate measurements to acquire and stabilize the wavelength of an optical resonant modulator to an optical carrier wave. This is attractive because it uses the pertinent metric, bit error rate, to optimize the modulator resonance independent of other system variations, mean...

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Bibliographic Details
Published inIEEE MICRO Vol. 33; no. 1; pp. 42 - 52
Main Authors Zortman, W. A., Lentine, A. L., Trotter, D. C., Watts, M. R.
Format Journal Article
LanguageEnglish
Published Los Alamitos IEEE 01.01.2013
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects
Active control
Carrier waves
Drift
Electronics
Heaters
Heating equipment
High performance computing
Logic gates
Measurement errors
Modulation
Modulators
Monitoring
Optical interconnections
Optical resonators
Optics
Optimization
Receivers
Resonant frequency
Resonators
Wavelengths
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Summary:A new method uses bit-error-rate measurements to acquire and stabilize the wavelength of an optical resonant modulator to an optical carrier wave. This is attractive because it uses the pertinent metric, bit error rate, to optimize the modulator resonance independent of other system variations, meaning it can compensate for system aging and drift even in the heater element itself.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0272-1732
1937-4143
DOI:10.1109/MM.2012.73