An X-ray diffraction study on dislocation microstructure of as-prepared Al-Al2O3 composites

Microstructure of alpha-Al2O3 containing Al-based composites were studied in terms of ab initio quasi-composite model of dislocation cell structure and ellipsoidal log-normal distribution of crystallite size alpha-Al2O3, present in the composites, affects dislocation motion during stress relaxation...

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Bibliographic Details
Published inActa materialia Vol. 52; no. 9; pp. 2755 - 2764
Main Authors DEB, A. K, CHATTERJEE, P, SEN GUPTA, S. P
Format Journal Article
LanguageEnglish
Published Oxford Elsevier Science 17.05.2004
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Summary:Microstructure of alpha-Al2O3 containing Al-based composites were studied in terms of ab initio quasi-composite model of dislocation cell structure and ellipsoidal log-normal distribution of crystallite size alpha-Al2O3, present in the composites, affects dislocation motion during stress relaxation at room temperature and may produce such a dislocation sub- structure. The region of high (about 8 x 10 exp 9/sq cm) and low (about 2 x 10 exp 9/sq cm) dislocation density has been characterized as cell walls and cell interiors, respectively, with compressive and tensile stresses, respectively, in accordance with the quasi-composite model. The results are in gross agreement with TEM studies.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:1359-6454
1873-2453
DOI:10.1016/j.actamat.2004.02.023