An X-ray diffraction study on dislocation microstructure of as-prepared Al-Al2O3 composites
Microstructure of alpha-Al2O3 containing Al-based composites were studied in terms of ab initio quasi-composite model of dislocation cell structure and ellipsoidal log-normal distribution of crystallite size alpha-Al2O3, present in the composites, affects dislocation motion during stress relaxation...
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Published in | Acta materialia Vol. 52; no. 9; pp. 2755 - 2764 |
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Main Authors | , , |
Format | Journal Article |
Language | English |
Published |
Oxford
Elsevier Science
17.05.2004
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Subjects | |
Online Access | Get full text |
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Summary: | Microstructure of alpha-Al2O3 containing Al-based composites were studied in terms of ab initio quasi-composite model of dislocation cell structure and ellipsoidal log-normal distribution of crystallite size alpha-Al2O3, present in the composites, affects dislocation motion during stress relaxation at room temperature and may produce such a dislocation sub- structure. The region of high (about 8 x 10 exp 9/sq cm) and low (about 2 x 10 exp 9/sq cm) dislocation density has been characterized as cell walls and cell interiors, respectively, with compressive and tensile stresses, respectively, in accordance with the quasi-composite model. The results are in gross agreement with TEM studies. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 23 |
ISSN: | 1359-6454 1873-2453 |
DOI: | 10.1016/j.actamat.2004.02.023 |