Comparison of ZnO and Ti-doped ZnO sensing membrane applied in electrolyte-insulator-semiconductor structure

In this paper, we demonstrate electrolyte-insulator-semiconductor devices for biochemical sensing applications prepared from ZnO and Ti-doped ZnO sensing membranes deposited on Si substrates by radio frequency sputtering. The structural, morphological, and compositional features of these deposited f...

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Bibliographic Details
Published inCeramics international Vol. 44; no. 6; pp. 6081 - 6088
Main Authors Lee, Ming Ling, Wang, Jer Chyi, Kao, Chyuan Haur, Chen, Hsiang, Lin, Chan Yu, Chang, Che Wei, Mahanty, Rama Krushna, Lin, Chun Fu, Chang, Kow Ming
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 15.04.2018
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Summary:In this paper, we demonstrate electrolyte-insulator-semiconductor devices for biochemical sensing applications prepared from ZnO and Ti-doped ZnO sensing membranes deposited on Si substrates by radio frequency sputtering. The structural, morphological, and compositional features of these deposited films with multitemperature annealing were studied using X-ray diffraction, atomic force microscopy, and X-ray photoelectron spectroscopy, respectively. Sensitivity, linearity, hysteresis, and drift rate were measured to determine the sensing and reliability performance of all fabricated devices. Compared to the ZnO electrolyte-insulator-semiconductor (EIS), the Ti-doped ZnO EIS sensor annealed at 700°C exhibits a higher sensitivity of 57.56mV/pH, lower hysteresis of 2.79mV, and lower drift rate of 0.29mV/h. For Ti-doped ZnO, sensitivities of 3.62mV/mM and 6.42mV/mM were obtained for urea and glucose sensing, respectively. The improvements are owing to Ti-doping, which produces a rougher sensing surface, a well-crystallized grain structure, and thinner silicate and SiO2 at the silicon-oxide interface.
ISSN:0272-8842
1873-3956
DOI:10.1016/j.ceramint.2017.12.239