Repair of double-strand breaks in plasmid DNA in the yeast Saccharomyces cerevisiae

We studied the repair of double-strand breaks (DSB) in plasmid DNA introduced into haploid cells of the yeast Saccharomyces cerevisiae. The efficiency of repair was estimated from the frequency of transformation of the cells by an autonomously replicated linearized plasmid. The frequency of "li...

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Bibliographic Details
Published inMolecular & general genetics Vol. 213; no. 2-3; p. 421
Main Authors Perera, J R, Glasunov, A V, Glaser, V M, Boreiko, A V
Format Journal Article
LanguageEnglish
Published Germany 01.08.1988
Subjects
DNA Repair
DNA, Fungal - genetics
Genes, Fungal
Kinetics
Mutation
Plasmids
Saccharomyces cerevisiae - genetics
Transformation, Genetic
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Summary:We studied the repair of double-strand breaks (DSB) in plasmid DNA introduced into haploid cells of the yeast Saccharomyces cerevisiae. The efficiency of repair was estimated from the frequency of transformation of the cells by an autonomously replicated linearized plasmid. The frequency of "lithium" transformation of Rad+ cells was increased greatly (by 1 order of magnitude and more) compared with that for circular DNA if the plasmid was initially linearized at the XhoI site within the LYS2 gene. This effect is due to recombinational repair of the plasmid DNA. Mutations rad52, rad53, rad54 and rad57 suppress the repair of DSB in plasmid DNA. The kinetics of DSB repair in plasmid DNA are biphasic: the first phase is completed within 1 h and the second within 14-18 h of incubating cells on selective medium.
ISSN:0026-8925
1432-1874
DOI:10.1007/BF00339611