Spectral distribution in the reflection of parametric X-rays

The parametric X-ray radiation (PXR) spectra are measured on condition when the angular size of PXR cone is smaller than the angular resolution of the experiment. The PXR is generated under interaction of 50GeV proton beam with silicon crystal in Bragg geometry. The comparison of experimental data w...

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Bibliographic Details
Published inJournal of physics. Conference series Vol. 517; no. 1; pp. 12018 - 7
Main Authors Chesnokov, Yu A, Shchagin, A V, Shul'ga, N F, Kubankin, A S, Potylitsyn, A P, Gogolev, A S, Uglov, S R, Cherepennikov, Yu M, Karataev, P
Format Journal Article
LanguageEnglish
Published Bristol IOP Publishing 01.01.2014
Subjects
Angular resolution
Crystals
Physics
Proton beams
Reflection
Silicon
Spectra
X ray reflection
X-rays
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Summary:The parametric X-ray radiation (PXR) spectra are measured on condition when the angular size of PXR cone is smaller than the angular resolution of the experiment. The PXR is generated under interaction of 50GeV proton beam with silicon crystal in Bragg geometry. The comparison of experimental data with results of developed theoretical model is presented and discussed.
Bibliography:ObjectType-Article-1
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ISSN:1742-6596
1742-6588
1742-6596
DOI:10.1088/1742-6596/517/1/012018