Metrology with PT-Symmetric Cavities: Enhanced Sensitivity near the PT-Phase Transition

We propose and analyze a new approach based on parity-time (PT) symmetric microcavities with balanced gain and loss to enhance the performance of cavity-assisted metrology. We identify the conditions under which PT-symmetric microcavities allow us to improve sensitivity beyond what is achievable in...

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Bibliographic Details
Published inPhysical review letters Vol. 117; no. 11; p. 110802
Main Authors Liu, Zhong-Peng, Zhang, Jing, Özdemir, Şahin Kaya, Peng, Bo, Jing, Hui, Lü, Xin-You, Li, Chun-Wen, Yang, Lan, Nori, Franco, Liu, Yu-Xi
Format Journal Article
LanguageEnglish
Published United States 09.09.2016
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Summary:We propose and analyze a new approach based on parity-time (PT) symmetric microcavities with balanced gain and loss to enhance the performance of cavity-assisted metrology. We identify the conditions under which PT-symmetric microcavities allow us to improve sensitivity beyond what is achievable in loss-only systems. We discuss the application of PT-symmetric microcavities to the detection of mechanical motion, and show that the sensitivity is significantly enhanced near the transition point from unbroken- to broken-PT regimes. Our results open a new direction for PT-symmetric physical systems and it may find use in ultrahigh precision metrology and sensing.
ISSN:1079-7114
DOI:10.1103/PhysRevLett.117.110802