Microstructural characterization of porous materials by two-dimensional X-ray refraction topography

• Published in: Colloids and surfaces. A, Physicochemical and engineering aspects Vol. 241; no. 1; pp. 225 - 229
• Main Authors: Harbich, K.-W, Klobes, P, Hentschel, M.P
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 14.07.2004
• Subjects: Al 2O 3 ceramics; Internal surface density; Pore size; Porosity fluctuation; X-ray refraction topography; Porosity fluctuation; Pore size; Al 2O 3 ceramics; X-ray refraction topography; Internal surface density
• ISSN: 0927-7757; 1873-4359
• DOI: 10.1016/j.colsurfa.2004.04.074

X-ray refraction topography determines the internal surfaces and interfaces of non-metallic porous materials within the range of namometer to micrometer dimensions. The method is based on refraction of X-rays caused by interfaces of microstructures in heterogeneous materials. Generally, it permits a non-destructive full volume characterization of the pore topology. The X-ray refraction scanning technique make possible to visualize integral interface properties up to 10 μm spatial resolution by two-dimensional topographic images. It detects the spatially resolved internal surfaces of both, open and closed pores. Comparison to a certified powder reference of uniform grain size and known packing density reveals a quantitative measure for calibration requirements. An investigation on SiC- and Al 2O 3-ceramics illustrate the quantitative characterization of the internal surface density, pore sizes and their spatial distribution as well as local porosity fluctuations.