Temperature dependence of microwave photoresistance in 2D electron systems

We report on the temperature dependence of microwave-induced resistance oscillations in high-mobility two-dimensional electron systems. We find that the oscillation amplitude decays exponentially with increasing temperature, as exp(-alphaT;{2}), where alpha scales with the inverse magnetic field. Th...

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Bibliographic Details
Published inPhysical review letters Vol. 102; no. 6; p. 066804
Main Authors Hatke, A T, Zudov, M A, Pfeiffer, L N, West, K W
Format Journal Article
LanguageEnglish
Published United States 13.02.2009
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Summary:We report on the temperature dependence of microwave-induced resistance oscillations in high-mobility two-dimensional electron systems. We find that the oscillation amplitude decays exponentially with increasing temperature, as exp(-alphaT;{2}), where alpha scales with the inverse magnetic field. This observation indicates that the temperature dependence originates primarily from the modification of the single particle lifetime, which we attribute to electron-electron interaction effects.
ISSN:0031-9007
DOI:10.1103/PhysRevLett.102.066804