Inverse magnetoresistance in textured Fe3O4 film

• Published in: Journal of alloys and compounds Vol. 649; pp. 239 - 243
• Main Authors: Liu, Er, Zhang, Wen, Zheng, Jian-Guo, Hu, Xuefeng, Ou, Huiling, Du, Ruxia, Kou, Chaoxia, Zhai, Ya, Xu, Qingyu, Du, Jun, Xu, Yongbing, Zhai, Hongru
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 15.11.2015
• Subjects: Inverse MR; Spintronics; Textured Fe3O4 film; XMCD; Textured Fe3O4 film; Inverse MR; XMCD; Spintronics
• ISSN: 0925-8388; 1873-4669
• DOI: 10.1016/j.jallcom.2015.07.108

A surprising inverse (positive) MR effect was observed in thin film of magnetite (Fe3O4) grown on Si substrate by pulsed laser deposition (PLD). Transmission electron microscopy (TEM) and X-ray diffraction (XRD) measurements show a highly (111)-textured growth and single phase nature of Fe3O4 thin film. X-Ray Magnetic Circular Dichroism (XMCD) and X-ray absorption spectroscopy (XAS) were employed to exclude the existence of γ-Fe2O3. The surface morphology of the film was investigated by atomic force microscopy (AFM). Based on the aforementioned studies, we proposed a spin dependent conduction mechanism to explain the observed anomalous MR effect. [Display omitted] •A positive magnetoresistance (MR) effect was observed on our Fe3O4/Si film.•The unique MR effect is distinct from the usual MR effect in Fe3O4 film.•HRTEM, XRD, AFM and XMCD techniques are performed to study the anomalous MR effect.•We proposed a new conduction mechanism to explain the anomalous MR effect.