Thin structure deflection measurement

Deflection curvature is easily observed during bending of thin structures. There are, however, few practical means available for measuring it. As a consequence, curvature measurements are extremely rare. Strain is usually the preferred measurand of choice. This preference is disadvantageous in the c...

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Bibliographic Details
Published inIEEE transactions on instrumentation and measurement Vol. 48; no. 3; pp. 705 - 710
Main Authors Djordjevich, A., YuZhu He
Format Journal Article
LanguageEnglish
Published IEEE 01.06.1999
Subjects
Bending
Capacitive sensors
Costs
Curvature
Deflection
Electrical resistance measurement
Instrumentation
Manufacturing automation
Mathematical analysis
Optical fiber sensors
Optical fibers
Optical materials
Sensors
Strain
Strain measurement
Strips
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Summary:Deflection curvature is easily observed during bending of thin structures. There are, however, few practical means available for measuring it. As a consequence, curvature measurements are extremely rare. Strain is usually the preferred measurand of choice. This preference is disadvantageous in the case of thin structures because strain can then be so small that very high resolution sensors are required despite the apparently large deflection curvature. A method of measuring such curvature is presented in this paper. Its conceptual advantages over strain measurement include: (1) position-invariant readings throughout the structural section; (2) sameness of the true and apparent measurands irrespective of the microstructural effects introduced by the sensor; (3) higher sensitivity in the case of thin structures.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 23
ISSN:0018-9456
1557-9662
DOI:10.1109/19.772201