Surface roughening by anisotropic adatom kinetics in epitaxial growth of La0.67Ca0.33MnO3

• Published in: Surface science Vol. 600; no. 6; pp. 1231 - 1239
• Main Authors: SANCHEZ, F, INFANTE, I. C, LÜDERS, U, ABAD, Ll, FONTCUBERTA, J
• Format: Journal Article
• Language: English
• Published: Lausanne Elsevier Science 15.03.2006; Amsterdam; New York, NY
• Subjects: Condensed matter: electronic structure, electrical, magnetic, and optical properties; Condensed matter: structure, mechanical and thermal properties; Cross-disciplinary physics: materials science; rheology; Exact sciences and technology; Physics; Thin films; Magnetic films; Atomic force microscopy; Epitaxy; Thin film structures; Adatoms; Oxides; Kinetics; Surface roughening; Sputter deposition
• ISSN: 0039-6028; 1879-2758
• DOI: 10.1016/j.susc.2006.01.008

The growth mechanisms and surface morphology of colossal magnetoresistance (CMR) La0.67Ca0.33MnO3 films deposited by rf magnetron sputtering on SrTi03(001) substrates are investigated. The films are epitaxial, coherently strained and ferromagnetic. It is found that at early growth stages, in nanometric films, a layer-by-layer mechanism dominates, which results in step and terrace surface morphology. Upon further growth, the flat surface becomes unstable when large two-dimensional (2D) islands form. The Erlich-Schwoebel step-edge energy barrier induces an anisotropic adatom kinetics that favors 2D nucleation on top of the islands as it reduces downhill adatom current. As a result, there is an evolution with growth to mound-like structures of increasing height. Critical thickness for mound formation and average mound separation can be tuned by substrate miscut angle and growth temperature. These results provide a detailed understanding of the roughening process in manganites and are relevant for the controlled fabrication of CMR films, in particular for its use in epitaxial heterostructures.