High-Voltage 4H-SiC-Based Avalanche Diodes with a Negative Bevel
High-voltage avalanche p + – p – n 0 – n + diodes based on 4 H –SiC are fabricated. The diodes are made in the form of mesa structures with flat side walls forming a negative bevel. The mesa structures are formed by the dry reactive ion etching of 4 H -SiC through a wedge-shaped photoresist mask. Th...
Saved in:
Published in | Semiconductors (Woodbury, N.Y.) Vol. 55; no. 4; pp. 405 - 409 |
---|---|
Main Authors | , , , , |
Format | Journal Article |
Language | English |
Published |
Moscow
Pleiades Publishing
01.04.2021
Springer Springer Nature B.V |
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | High-voltage avalanche
p
+
–
p
–
n
0
–
n
+
diodes based on 4
H
–SiC are fabricated. The diodes are made in the form of mesa structures with flat side walls forming a negative bevel. The mesa structures are formed by the dry reactive ion etching of 4
H
-SiC through a wedge-shaped photoresist mask. The mesas have an area of 1 mm
2
, a height of 3.6 μm (slightly exceeding the bedding depth of 3 μm of the
p
–
n
0
junction), and the angle of inclination of the side walls is ~5° from the plane of the
p
–
n
0
junction. The
I
–
V
characteristics of the manufactured diodes are measured. At a current of 10 A, the differential resistance of the diodes and the voltage drop in the forward direction are 0.35 Ω and 6.5 V, respectively. In the reverse direction, the diodes exhibit an abrupt breakdown at voltages from 1420 to 1500 V. Using TCAD simulation, the reverse
I
–
V
characteristic of an idealized one-dimensional diode with the same parameters of the structure as in real diodes is calculated. The calculated voltage of a one-dimensional avalanche breakdown diode (1450 V) falls within the measured value range; i.e., the efficiency of the negative bevel as a security circuit is close to 100%. The pulsed reverse
I
–
V
characteristics of diodes in the powerful-avalanche breakdown mode are measured: the differential resistance is ~3 Ω, which indicates that the avalanche breakdown is uniform in area. The diodes withstand without destruction avalanche-current pulses with an amplitude of at least 10 A (current density of 10
3
A/cm
2
) and a duration of 1.2 μs (dissipated energy of 9 mJ). |
---|---|
ISSN: | 1063-7826 1090-6479 |
DOI: | 10.1134/S1063782621040059 |