The new external beam facility of the Oxford scanning proton microprobe

• Published in: Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 181; no. 1; pp. 66 - 70
• Main Authors: Grime, G.W, Abraham, M.H, Marsh, M.A
• Format: Journal Article
• Language: English
• Published: Elsevier B.V 01.07.2001
• Subjects: Ion beam analysis; Microbeam analysis; Non-destructive analysis; PIXE; RBS; RBS; PIXE; Microbeam analysis; Ion beam analysis; Non-destructive analysis
• ISSN: 0168-583X; 1872-9584
• DOI: 10.1016/S0168-583X(01)00616-4

This paper describes the development of a high spatial resolution external beam facility on one of the beamlines of the Oxford scanning proton microprobe tandem accelerator. Using a magnetic quadrupole doublet to focus the beam through the Kapton exit window a beam diameter of <50 μm full width at half maximum (fwhm) can be achieved on a sample located at 4 mm from the exit window. The facility is equipped with two Si–Li X-ray detectors for proton-induced X-ray emission (PIXE) analysis of light and trace elements respectively, a surface barrier detector for Rutherford backscattering spectrometry (RBS) analysis and a HP-Ge detector for γ-ray detection. The mechanical and beam-optical design of the system is described.