Geometric and electronic structures of molecularly adsorbed NO at low surface coverage on polycrystalline rhodium studied by NEXAFS and resonant Auger spectroscopy

The differences in the geometric and electronic structures of molecularly adsorbed NO on polycrystalline rhodium at low and high surface coverages are investigated by means of near-edge X-ray absorption fine structure (NEXAFS) and resonant Auger spectroscopy. At low surface coverage, the NEXAFS spec...

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Bibliographic Details
Published inSurface science Vol. 433; pp. 293 - 296
Main Authors Saito, T., Kudo, Y., Furuya, K., Kikuchi, T., Imamura, M., Matsubayashi, N., Shimada, H.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 02.08.1999
Subjects
Adsorption
NEXAFS
Nitric oxide
Polycrystalline surface
Resonant Auger spectroscopy
Rhodium
NEXAFS
Adsorption
Rhodium
Polycrystalline surface
Nitric oxide
Resonant Auger spectroscopy
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ISSN0039-6028
1879-2758
DOI10.1016/S0039-6028(99)00164-8

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Summary:The differences in the geometric and electronic structures of molecularly adsorbed NO on polycrystalline rhodium at low and high surface coverages are investigated by means of near-edge X-ray absorption fine structure (NEXAFS) and resonant Auger spectroscopy. At low surface coverage, the NEXAFS spectra showed elongation of the NO bond. In addition, the resonant Auger results indicated a stronger interaction between NO 5σ and metal d orbitals. From these results, it was speculated that the NO species observed at low surface coverage was strongly adsorbed on rhodium and subject to catalytic reaction in the next step.
ISSN:0039-6028
1879-2758
DOI:10.1016/S0039-6028(99)00164-8