Simulation of the growth of near-surface defects

The growth of near-surface circular and elliptical defects is simulated by using an eigenstrain-based solution for the crack front stress intensity factor. From these results the crack growth rate at all points is inferred from Paris' law, and the crack front is advanced. The stress intensity f...

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Bibliographic Details
Published inEngineering fracture mechanics Vol. 59; no. 4; pp. 415 - 424
Main Authors Dai, D.N., Hills, D.A., Härkegard, G., Pross, J.
Format Journal Article
LanguageEnglish
Published Elsevier Ltd 01.03.1998
Subjects
crack shape evolution
eigenstrain method
subsurface defect
crack shape evolution
subsurface defect
eigenstrain method
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Summary:The growth of near-surface circular and elliptical defects is simulated by using an eigenstrain-based solution for the crack front stress intensity factor. From these results the crack growth rate at all points is inferred from Paris' law, and the crack front is advanced. The stress intensity factors are re-evaluated, and the new crack front shape implied by Paris' law found. This process, which allows the crack front shape to evolve freely, is repeated until final fracture occurs. The results are then compared with predictions of component life based on simplified “engineering” analysis, where the crack shape at each stage during its life is idealised as an ellipse (if buried) or a semi-ellipse (if surface-breaking).
ISSN:0013-7944
1873-7315
DOI:10.1016/S0013-7944(97)00178-1