Ion beam analysis with external beams: Recent set-up improvements

Accelerator-based analytical techniques using external beams are ideally fitted to the study of works of art because of their fully non-destructive character. However, accurate quantitative analysis is not straightforward, due in particular to difficult beam monitoring. Significant improvements have...

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Bibliographic Details
Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 188; no. 1; pp. 135 - 140
Main Authors Calligaro, T., Dran, J.-C., Moignard, B., Pichon, L., Salomon, J., Walter, Ph
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.04.2002
Subjects
External beam
PIXE
RBS
External beam
RBS
29.27.AC
PIXE
34.50.Bw
82.80.Yc
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Summary:Accelerator-based analytical techniques using external beams are ideally fitted to the study of works of art because of their fully non-destructive character. However, accurate quantitative analysis is not straightforward, due in particular to difficult beam monitoring. Significant improvements have been progressively made on the external beam line of the IBA facility of the Louvre museum in order to increase the accuracy and to conduct combined analyses with different IBA techniques.
ISSN:0168-583X
1872-9584
DOI:10.1016/S0168-583X(01)01062-X