Process capability index for AC transformer under electrical harmonics

Nowadays, the quality of electronic devices is subjected to many variables such as electrical, thermal, mechanical and environmental factors. Voltage variation induced by electrical harmonics presented in the power lines is one of the main causes for electronic products to reduce their quality and p...

Full description

Saved in:
Bibliographic Details
Published inElectrical engineering Vol. 100; no. 2; pp. 347 - 353
Main Authors Méndez-González, Luis Carlos, Rodríguez-Picón, Luis Alberto, Quezada-Carreón, Abel Eduardo, Romero-López, Roberto, Garcia, Vicente
Format Journal Article
LanguageEnglish
Published Berlin/Heidelberg Springer Berlin Heidelberg 01.06.2018
Springer Nature B.V
Subjects
Capability indices
Case studies
Economics and Management
Electric potential
Electrical Engineering
Electrical Machines and Networks
Electronic devices
Energy Policy
Engineering
Harmonics
Original Paper
Power Electronics
Power lines
Transformers
Electrical harmonics
Process capability index
Transformers
Reliability
Power quality issues
Inverse power law
Online AccessGet full text

Cover

More Information
Summary:Nowadays, the quality of electronic devices is subjected to many variables such as electrical, thermal, mechanical and environmental factors. Voltage variation induced by electrical harmonics presented in the power lines is one of the main causes for electronic products to reduce their quality and performance in an operational environment. In this study, more significant variables are addressed, and a comparative study between voltage variations with and without electrical harmonics is presented. The case study presented in this paper is based on a transformer under voltage scenarios proposed in this study. The corresponding Cpk index in the transformer was estimated using a non-normal tool. The results of the case study showed that laptop computer under electrical harmonics has a lower Cpk rank and that Cpk value impacts directly the lifetime and performance of the device.
ISSN:0948-7921
1432-0487
DOI:10.1007/s00202-017-0509-3