Time-resolved study and molecular dynamics simulation of defect centers in BaFX (X=Cl, Br) crystals

Some new evidence to determine the origin of the F-aggregate centers located in the near-IR region in BaFX (X=Cl, Br) crystals is demonstrated through a series of measurements and molecular dynamics simulations. Moreover, a new method to determine the concentration of the F centers in the photostimu...

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Bibliographic Details
Published inJournal of luminescence Vol. 87; pp. 558 - 560
Main Authors Kurobori, T, Inabe, K, Aoshima, S, Itoh, T, Takeuchi, M, Radzhabov, E
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.05.2000
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Summary:Some new evidence to determine the origin of the F-aggregate centers located in the near-IR region in BaFX (X=Cl, Br) crystals is demonstrated through a series of measurements and molecular dynamics simulations. Moreover, a new method to determine the concentration of the F centers in the photostimulable materials is also demonstrated.
ISSN:0022-2313
1872-7883
DOI:10.1016/S0022-2313(99)00292-6