Time-resolved study and molecular dynamics simulation of defect centers in BaFX (X=Cl, Br) crystals
Some new evidence to determine the origin of the F-aggregate centers located in the near-IR region in BaFX (X=Cl, Br) crystals is demonstrated through a series of measurements and molecular dynamics simulations. Moreover, a new method to determine the concentration of the F centers in the photostimu...
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Published in | Journal of luminescence Vol. 87; pp. 558 - 560 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
Elsevier B.V
01.05.2000
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Subjects | |
Online Access | Get full text |
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Summary: | Some new evidence to determine the origin of the F-aggregate centers located in the near-IR region in BaFX (X=Cl, Br) crystals is demonstrated through a series of measurements and molecular dynamics simulations. Moreover, a new method to determine the concentration of the F centers in the photostimulable materials is also demonstrated. |
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ISSN: | 0022-2313 1872-7883 |
DOI: | 10.1016/S0022-2313(99)00292-6 |