Simple procedure for robust and accurate complex permittivity measurements of low-loss materials over a broad frequency band

In this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical and analytical analyses the main ill-behaved factor that gives rise to inac...

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Bibliographic Details
Published inJournal of electromagnetic waves and applications Vol. 28; no. 8; pp. 903 - 915
Main Authors Hasar, U.C., Barroso, J.J., Kaya, Y., Bute, M., Ertugrul, M.
Format Journal Article
LanguageEnglish
Published Taylor & Francis 24.05.2014
Subjects
low-loss samples
materials testing
microwave measurements
permittivity
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Summary:In this research paper, we propose a simple procedure for accurate, stable and broadband measurements of complex permittivity of low-loss dielectric samples with considerable lengths. We identify and demonstrate by numerical and analytical analyses the main ill-behaved factor that gives rise to inaccurate peaks for measurements of electrical properties of low-loss samples in the well-known Nicolson-Ross-Weir method. Without using this factor in the expressions and combining better features of the methods available in the literature, the proposed procedure allows highly accurate permittivity measurements over a broad band. We have validated the proposed method by permittivity measurements of a low-loss sample by different methods.
ISSN:0920-5071
1569-3937
DOI:10.1080/09205071.2014.896227