Comparative analysis of plant cuticular waxes using HATR FT-IR reflection technique

The utility of horizontal attenuated total reflection HATR FT-IR technique for preliminary plant leaf cuticular waxes qualitative analysis was studied. Detection and identification of small amounts of surface compounds were achieved. The main components of analysed samples were long-chain aliphatic...

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Bibliographic Details
Published inJournal of molecular structure Vol. 511-512; pp. 173 - 179
Main Authors Dubis, E.N., Dubis, A.T., Morzycki, J.W.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 23.11.1999
Subjects
ATR
IR spectroscopy
Plant cuticular wax
Surface lipids
Plant cuticular wax
IR spectroscopy
Surface lipids
ATR
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Summary:The utility of horizontal attenuated total reflection HATR FT-IR technique for preliminary plant leaf cuticular waxes qualitative analysis was studied. Detection and identification of small amounts of surface compounds were achieved. The main components of analysed samples were long-chain aliphatic compounds, mainly hydrocarbons. Weak absorption in the range of 1717–1738cm−1 indicated the presence of some compounds containing carbonyl groups. In the case of direct HATR analysis of potato leaf surface, an additional broad band of water was observed. The results obtained by infrared methods are in good agreement with HPLC analyses. HATR FT-IR is convenient and a rapid method of preliminary evaluation of surface plant material composition, especially for esters, ketones and aldehydes.
ISSN:0022-2860
1872-8014
DOI:10.1016/S0022-2860(99)00157-X