X-ray Pendellösung in garnet epitaxial layers
X-ray Pendellösung interference has been observed in reflection in garnet epitaxial layers. The reflection case differs from the well-studied transmission case in that the two interfering wave fields are generated one at the front surface and one at the back surface of the layer. Absolute thickness...
Saved in:
| Published in | Journal of crystal growth Vol. 27; pp. 282 - 286 |
|---|---|
| Main Authors | , |
| Format | Journal Article |
| Language | English |
| Published |
Elsevier B.V
01.01.1974
|
| Online Access | Get full text |
Cover
Loading…
| Summary: | X-ray Pendellösung interference has been observed in reflection in garnet epitaxial layers. The reflection case differs from the well-studied transmission case in that the two interfering wave fields are generated one at the front surface and one at the back surface of the layer. Absolute thickness measurements of the layer are obtained by recording the interference maxima as a function of the specimen orientation and “fringe topographs” reveal local bending of the layer lattice planes. |
|---|---|
| ISSN: | 0022-0248 1873-5002 |
| DOI: | 10.1016/S0022-0248(74)80075-8 |