Ion beam modification of thermal stress resistance of MgO single crystals with different crystallographic faces

Ion beam modification of thermal shock stress resistance of MgO single crystals with various crystallographic faces is investigated. The most stable crystal faces in terms of stress and damage resistance are established. Ion implantation is shown to reduce the temperature threshold of fracture for a...

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Published inNuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms Vol. 178; no. 1; pp. 138 - 143
Main Authors Gurarie, V.N, Otsuka, P.H, Williams, J.S, Conway, M.J
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.05.2001
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Summary:Ion beam modification of thermal shock stress resistance of MgO single crystals with various crystallographic faces is investigated. The most stable crystal faces in terms of stress and damage resistance are established. Ion implantation is shown to reduce the temperature threshold of fracture for all crystal faces tested. The (1 1 1) face is demonstrated to be of highest stability compared to (1 1 0) and (1 0 0) faces in both implanted and unimplanted crystals. At the same time ion implantation substantially increases the microcrack density for all the faces tested and reduces the degree of fracture damage following thermal shock. The theoretical resistance parameters for various crystal faces are calculated using the continuum mechanics approach. The results are discussed on the basis of fracture mechanics principles and the effect of the implantation-induced lattice damage on crack nucleation.
ISSN:0168-583X
1872-9584
DOI:10.1016/S0168-583X(01)00512-2