Conductor and dielectric-property extraction using microstrip tee resonators

A pair of microstrip tee resonators, each with a different impedance resonating element, are employed to extract conductor‐sheet resistance as well as dielectric properties. The method's performance is evaluated for copper lines on microwave laminate substrate. © 2005 Wiley Periodicals, Inc. Mi...

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Bibliographic Details
Published inMicrowave and optical technology letters Vol. 47; no. 1; pp. 14 - 16
Main Authors Fulford, Andrew R., Wentworth, Stuart M.
Format Journal Article
LanguageEnglish
Published Hoboken Wiley Subscription Services, Inc., A Wiley Company 05.10.2005
Subjects
dielectric characterization
microstrip attenuation
microstrip resonators
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Summary:A pair of microstrip tee resonators, each with a different impedance resonating element, are employed to extract conductor‐sheet resistance as well as dielectric properties. The method's performance is evaluated for copper lines on microwave laminate substrate. © 2005 Wiley Periodicals, Inc. Microwave Opt Technol Lett 47: 14–16, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.21067
Bibliography:Auburn University Information Technology Peak of Excellence
Naval Surface Warfare Center, Crane Division - No. PO A150200586
ArticleID:MOP21067
Alabama Microelectronics Science and Technology Center
ark:/67375/WNG-1PQV37ZF-9
istex:44C22C0779F592E4AC48ACF4917D943CB48AD42B
ISSN:0895-2477
1098-2760
DOI:10.1002/mop.21067