Morphological evolution of thin gold films studied by Auger electron spectroscopy in beading conditions

• Published in: Applied physics. A, Materials science & processing Vol. 78; no. 7; pp. 1079 - 1084
• Main Authors: BESZEDA, I, SZABO, I. A, GONTIER-MOYA, E. G
• Format: Journal Article
• Language: English
• Published: Berlin Springer 01.04.2004
• Subjects: Agglomeration; Auger electron spectroscopy; Beading; Beads; Condensed matter: structure, mechanical and thermal properties; Deposition; Evolution; Exact sciences and technology; Gold; Physics; Structure and morphology; thickness; Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties); Thin film structure and morphology; Thin films; Thin films; Atomic force microscopy; Gold; Annealing; Transition elements; Surface diffusion; Diffusion coefficient; Experimental study; Microstructure; Ultrahigh vacuum; Self-diffusion; AES
• ISSN: 0947-8396; 1432-0630
• DOI: 10.1007/s00339-003-2170-0

The evolution of thin gold films deposited on a sapphire surface was studied in UHV using Auger electron spectroscopy and atomic force microscopy techniques. The annealing temperatures were in the range 573--843 K. Starting from a continuous film, we observed at the end of the process a collection of beads. The incubation time in this temperature range was negligible, while the agglomeration time varied from about 2 h at 573 K to a few minutes at 843 K. The kinetics of metal agglomeration allowed the evaluation of the surface self diffusion coefficients of gold which can be expressed by