Axial bloch wave channeling of 15 MeV electrons in silicon

Experimental transmission profiles of 15 MeV electrons in silicon [111] have been measured. They show a fine structure which is not reproduced by a classical calculation. On the basis of the dynamical theory of diffraction a 331-beam calculation has been performed to interpret the experimental curve...

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Bibliographic Details
Published inPhysics letters. A Vol. 58; no. 4; pp. 252 - 254
Main Authors Schiebel, U., Worm, E.
Format Journal Article
LanguageEnglish
Published Elsevier B.V 01.01.1976
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Summary:Experimental transmission profiles of 15 MeV electrons in silicon [111] have been measured. They show a fine structure which is not reproduced by a classical calculation. On the basis of the dynamical theory of diffraction a 331-beam calculation has been performed to interpret the experimental curves.
ISSN:0375-9601
1873-2429
DOI:10.1016/0375-9601(76)90089-X