Label enhanced and patch based deep learning for phase retrieval from single frame fringe pattern in fringe projection 3D measurement

• Published in: Optics express Vol. 27; no. 20; p. 28929
• Main Authors: Shi, Jiashuo, Zhu, Xinjun, Wang, Hongyi, Song, Limei, Guo, Qinghua
• Format: Journal Article
• Language: English
• Published: 30.09.2019
• ISSN: 1094-4087; 1094-4087
• DOI: 10.1364/OE.27.028929

We propose a label enhanced and patch based deep learning phase retrieval approach which can achieve fast and accurate phase retrieval using only several fringe patterns as training dataset. To the best of our knowledge, it is the first time that the advantages of the label enhancement and patch str...