Interferometric polarization mode dispersion measurements with femtosecond sensitivity

• Published in: Journal of lightwave technology Vol. 15; no. 10; pp. 1852 - 1857
• Main Authors: Oberson, P., Julliard, K., Gisin, N., Passy, R., Von der Weid, J.P.
• Format: Journal Article
• Language: English
• Published: New York, NY IEEE 01.10.1997; Institute of Electrical and Electronics Engineers
• Subjects: Applied sciences; Circuit properties; Electric, optical and optoelectronic circuits; Electromagnetic fields; Electromagnetic measurements; Electronics; Exact sciences and technology; Instruments, apparatus, components and techniques common to several branches of physics and astronomy; Integrated optics. Optical fibers and wave guides; Interferometers; Light sources; Measurement standards; Measurement techniques; Optical and optoelectronic circuits; Optical fiber devices; Optical fiber polarization; Optical fiber testing; Optical instruments, equipment and techniques; Optical interferometry; Physics; Polarization mode dispersion; Measurement technique; Light dispersion; Optical fiber; Interferometry; Polarization mode
• ISSN: 0733-8724; 1558-2213
• DOI: 10.1109/50.633573

The standard interferometric measurement technique for polarization mode dispersion (PMD) measures the cross correlation of the electromagnetic field at the output of the fiber or optical device under test when a broadband light source is used. The sensitivity (smallest measurable PMD delay) of this technique is limited by the coherence time of the light source. In this contribution, we critically analyze extensions of the interferometric technique to lower values and present a new extension which provides a sensitivity of a few femtoseconds.